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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zldm</journal-id><journal-title-group><journal-title xml:lang="ru">Заводская лаборатория. Диагностика материалов</journal-title><trans-title-group xml:lang="en"><trans-title>Industrial laboratory. Diagnostics of materials</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1028-6861</issn><issn pub-type="epub">2588-0187</issn><publisher><publisher-name>ООО «Издательство «ТЕСТ-ЗЛ»</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.26896/1028-6861-2020-86-7-39-44</article-id><article-id custom-type="elpub" pub-id-type="custom">zldm-1242</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ИССЛЕДОВАНИЕ СТРУКТУРЫ И СВОЙСТВ. ФИЗИЧЕСКИЕ МЕТОДЫ ИССЛЕДОВАНИЯ И КОНТРОЛЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>TESTING OF STRUCTURE AND PARAMETERS. PHYSICAL METHODS OF TESTING AND QUALITY CONTROL</subject></subj-group></article-categories><title-group><article-title>Оценка показателей точности определения толщины покрытий методом шарового истирания</article-title><trans-title-group xml:lang="en"><trans-title>Evaluation of the accuracy indicators in determination of the coating thickness by crater grinding method</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Гоголинский</surname><given-names>К. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Gogolinsky</surname><given-names>K. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Кирилл Валерьевич Гоголинский</p><p>199106, г. С.-Петербург, Васильевский остров, 21-я линия, д. 2</p></bio><bio xml:lang="en"><p>Kirill V. Gogolinsky</p><p>2, 21 liniya Vasilyevskogo ostrova, St. Petersburg, 199106</p></bio><email xlink:type="simple">varya199.7@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ивкин</surname><given-names>А. Е.</given-names></name><name name-style="western" xml:lang="en"><surname>Ivkin</surname><given-names>A. E.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Антон Евгеньевич Ивкин</p><p>199106, г. С.-Петербург, Васильевский остров, 21-я линия, д. 2</p><p>198095, г. С.-Петербург, а/я 42</p></bio><bio xml:lang="en"><p>Anton E. Ivkin</p><p>2, 21 liniya Vasilyevskogo ostrova, St. Petersburg, 199106</p><p>P. O. box 42, St. Petersburg, 198095</p></bio><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Алехнович</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Alekhnovich</surname><given-names>V. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Варвара Владимировна Алехнович</p><p>199106, г. С.-Петербург, Васильевский остров, 21-я линия, д. 2</p></bio><bio xml:lang="en"><p>Varvara V. Alekhnovich</p><p>2, 21 liniya Vasilyevskogo ostrova, St. Petersburg, 199106</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Васильев</surname><given-names>А. Ю.</given-names></name><name name-style="western" xml:lang="en"><surname>Vasiliev</surname><given-names>A. Yu.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Алексей Юрьевич Васильев</p><p>198095, г. С.-Петербург, а/я 42</p><p>190005, С.-Петербург, Московский пр. 19</p></bio><bio xml:lang="en"><p>Aleksey Yu. Vasiliev</p><p>P. O. box 42, St. Petersburg, 198095</p><p>19, Moskovsky pr., St. Petersburg, 190005</p></bio><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тюрнина</surname><given-names>А. Е.</given-names></name><name name-style="western" xml:lang="en"><surname>Tyurnina</surname><given-names>A. E.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Анастасия Евгеньевна Тюрнина</p><p>620000, г. Екатеринбург, ул. Красноармейская 4</p></bio><bio xml:lang="en"><p>Anastasia E. Tyurnina</p><p>4, ul. Krasnoarmeyskaya, Yekaterinburg, 620000</p></bio><xref ref-type="aff" rid="aff-4"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Васильев</surname><given-names>А. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Vasiliev</surname><given-names>A. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Александр Сергеевич Васильев</p><p>620000, г. Екатеринбург, ул. Красноармейская 4</p></bio><bio xml:lang="en"><p>Alexander S. Vasiliev</p><p>4, ul. Krasnoarmeyskaya, Yekaterinburg, 620000</p></bio><xref ref-type="aff" rid="aff-4"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Санкт-Петербургский горный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>St. Petersburg Mining University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Санкт-Петербургский горный университет; ООО «КОНСТАНТА»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>St. Petersburg Mining University; Constanta LLC</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>ООО «КОНСТАНТА»; ВНИИМ имени Д. И. Менделеева</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Constanta LLC; D. I. Mendeleyev Metrology Institute</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-4"><aff xml:lang="ru"><institution>УНИИМ — филиал ВНИИМ имени Д. И. Менделеева</institution><country>Россия</country></aff><aff xml:lang="en"><institution>UNIIM — D. I. Mendeleyev Metrology Institute Branch</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>18</day><month>07</month><year>2020</year></pub-date><volume>86</volume><issue>7</issue><fpage>39</fpage><lpage>44</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Гоголинский К.В., Ивкин А.Е., Алехнович В.В., Васильев А.Ю., Тюрнина А.Е., Васильев А.С., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Гоголинский К.В., Ивкин А.Е., Алехнович В.В., Васильев А.Ю., Тюрнина А.Е., Васильев А.С.</copyright-holder><copyright-holder xml:lang="en">Gogolinsky K.V., Ivkin A.E., Alekhnovich V.V., Vasiliev A.Y., Tyurnina A.E., Vasiliev A.S.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.zldm.ru/jour/article/view/1242">https://www.zldm.ru/jour/article/view/1242</self-uri><abstract><p>Толщина — один из ключевых параметров, характеризующих качество и функциональные свойства покрытий. Для ее измерения чаще всего на практике используют различные косвенные методы (электромагнитные, радиационные, оптические), основанные на функциональной зависимости того или иного физического параметра системы основание — покрытие от толщины последнего. Основное ограничение точности при этом — чувствительность способов определения к свойствам покрытий. Поэтому актуально развитие и внедрение подходов, включающих непосредственное измерение геометрических параметров покрытия. Однако они зачастую относятся к разрушающим методам, требующим специального оборудования, и должны проходить метрологическую аттестацию (ГОСТ Р 8.563–2009). В статье предложен способ определения толщины покрытий методом абразивного шарового истирания. Приведены технические режимы необходимого испытательного оборудования, алгоритм проведения измерений и расчетные формулы. Представлены результаты оценки показателей точности предлагаемой методики расчетным и экспериментальным способами (в обоих случаях относительная погрешность не превышала 6 %). Показано, что методика применима для широкого спектра материалов покрытий (от мягких металлов до сверхтвердых керамик) толщиной от единиц до сотен микрометров и может быть рекомендована не только для технологического и выходного контроля, но и в качестве референтного подхода для метрологической аттестации мер и настроечных образцов для различных типов толщиномеров.</p></abstract><trans-abstract xml:lang="en"><p>Thickness is one of the key indicators characterizing the quality and functional properties of coatings. Various indirect methods (electromagnetic, radiation, optical) most often used in practice to measure thickness are based on the functional dependence of a particular physical parameter of the system «base – coating» on the coating thickness. The sensitivity of these procedures to the certain properties of coatings imposes the main restriction to the accuracy of measurements. Therefore, the development and implementation of the approaches based on direct measurements of geometric parameters of the coating appears expedient. These methods often belong to the class of «destructive» and, in addition to measuring instruments, require the use of special equipment. To ensure the uniformity of measurements in the laboratory or technological control, these methods are isolated as a separate procedure (method) and must undergo metrological certification in accordance with GOST R 8.563–2009. We present implementation, metrological certification and practical application of the method for measuring thickness of coatings by crater-grinding method. The principles of technical implementation of test equipment, measurement procedure and calculation formulas are described. The results of evaluating the accuracy indicators of the proposed procedure by calculation and experimental methods are presented. In both cases, the relative error did not exceed 6%. The applicability of the developed technique is shown for a wide range of coating materials (from soft metals to superhard ceramics) of different thickness (with from units to hundreds of micrometers). Apart from the goals of process control and outgoing inspection, the method can be recommended as a reference measurement procedure for calibration of measures and adjusting samples for various types of thickness gauges.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>метрология</kwd><kwd>толщина покрытия</kwd><kwd>метод шарового истирания</kwd><kwd>методика измерений</kwd><kwd>референтная методика</kwd><kwd>показатели точности</kwd></kwd-group><kwd-group xml:lang="en"><kwd>metrology</kwd><kwd>coating thickness</kwd><kwd>crater-grinding method</kwd><kwd>measurement procedure</kwd><kwd>reference measurement procedure</kwd><kwd>measurement accuracy</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Голубев С. С., Бабаджанов Л. С., Бабаджанова М. Л. 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