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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zldm</journal-id><journal-title-group><journal-title xml:lang="ru">Заводская лаборатория. Диагностика материалов</journal-title><trans-title-group xml:lang="en"><trans-title>Industrial laboratory. Diagnostics of materials</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1028-6861</issn><issn pub-type="epub">2588-0187</issn><publisher><publisher-name>ООО «Издательство «ТЕСТ-ЗЛ»</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.26896/1028-6861-2026-92-3-8-17</article-id><article-id custom-type="elpub" pub-id-type="custom">zldm-2755</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>АНАЛИЗ ВЕЩЕСТВА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>SUBSTANCES ANALYSIS</subject></subj-group></article-categories><title-group><article-title>Новый источник возбуждения спектров на основе азотной микроволновой плазмы с частотой 915 МГц для атомно-эмиссионной спектрометрии</article-title><trans-title-group xml:lang="en"><trans-title>A new source of spectral excitation based on nitrogen microwave induced plasma with a frequency of 915 MHz for atomic emission spectrometry</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Пелипасов</surname><given-names>О. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Pelipasov</surname><given-names>O. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Олег Владимирович Пелипасов</p><p>630090, г. Новосибирск, просп. Академика Коптюга, д. 1</p></bio><bio xml:lang="en"><p>Oleg V. Pelipasov</p><p>1, prosp. Akad. Koptyuga, Novosibirsk, 630090</p></bio><email xlink:type="simple">pelipasov@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Комин</surname><given-names>О. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Komin</surname><given-names>O. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Олег Владимирович Комин</p><p>630090, г. Новосибирск, просп. Академика Коптюга, д. 1</p></bio><bio xml:lang="en"><p>Oleg V. Komin</p><p>1, prosp. Akad. Koptyuga, Novosibirsk, 630090</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Лабусов</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Labusov</surname><given-names>V. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Владимир Александрович Лабусов</p><p>630090, г. Новосибирск, просп. Академика Коптюга, д. 1</p></bio><bio xml:lang="en"><p>Vladimir A. Labusov</p><p>1, prosp. Akad. Koptyuga, Novosibirsk, 630090</p></bio><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Чернов</surname><given-names>К. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Chernov</surname><given-names>K. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Константин Николаевич Чернов</p><p>630090, г. Новосибирск, просп. Академика Коптюга, д. 1</p></bio><bio xml:lang="en"><p>Konstantin N. Chernov</p><p>1, prosp. Akad. Koptyuga, Novosibirsk, 630090</p></bio><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Скоробогатов</surname><given-names>Д. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Skorobogatov</surname><given-names>D. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Дмитрий Николаевич Скоробогатов</p><p>630090, г. Новосибирск, просп. Академика Коптюга, д. 1</p></bio><bio xml:lang="en"><p>Dmitry N. Skorobogatov</p><p>1, prosp. Akad. Koptyuga, Novosibirsk, 630090</p></bio><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Морозов</surname><given-names>А. О.</given-names></name><name name-style="western" xml:lang="en"><surname>Morozov</surname><given-names>A. O.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Александр Олегович Морозов</p><p>141190, Московская область, г. Фрязино, Вокзальная ул., д. 2А</p></bio><bio xml:lang="en"><p>Aleksandr O. Morozov</p><p>2A, Vokzalnaya ul., Fryazino, Moscow obl., 141190</p></bio><xref ref-type="aff" rid="aff-4"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru">Институт автоматики и электрометрии СО РАН<country>Россия</country></aff><aff xml:lang="en">Institute of Automation and Electrometry of the Siberian Branch of the Russian Academy of Sciences<country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru">Институт автоматики и электрометрии СО РАН; ООО «ВМК-Оптоэлектроника»<country>Россия</country></aff><aff xml:lang="en">Institute of Automation and Electrometry of the Siberian Branch of the Russian Academy of Sciences; LLC «VMK-Optoelektronika»<country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru">ООО «ВМК-Оптоэлектроника»<country>Россия</country></aff><aff xml:lang="en">LLC «VMK-Optoelektronika»<country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-4"><aff xml:lang="ru">АО «НПП «Магратеп»»<country>Россия</country></aff><aff xml:lang="en">CJSC «Research and Production Enterprise «Magratep»<country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2026</year></pub-date><pub-date pub-type="epub"><day>26</day><month>03</month><year>2026</year></pub-date><volume>92</volume><issue>3</issue><fpage>8</fpage><lpage>17</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Пелипасов О.В., Комин О.В., Лабусов В.А., Чернов К.Н., Скоробогатов Д.Н., Морозов А.О., 2026</copyright-statement><copyright-year>2026</copyright-year><copyright-holder xml:lang="ru">Пелипасов О.В., Комин О.В., Лабусов В.А., Чернов К.Н., Скоробогатов Д.Н., Морозов А.О.</copyright-holder><copyright-holder xml:lang="en">Pelipasov O.V., Komin O.V., Labusov V.A., Chernov K.N., Skorobogatov D.N., Morozov A.O.</copyright-holder><license license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.zldm.ru/jour/article/view/2755">https://www.zldm.ru/jour/article/view/2755</self-uri><abstract><p>Создан экспериментальный образец нового источника возбуждения спектров (ИВС) на основе микроволновой плазмы (МП) с частотой возбуждающего поля 915 МГц и мощностью до 3000 Вт. Плазма в этом источнике возбуждается волной H011 в цилиндрическом СВЧ-резонаторе с установленным внутри диэлектрическим элементом и имеет форму и размеры, близкие к аргоновой ИСП. В сравнении с традиционной микроволновой плазмой с частотой возбуждения 2450 МГц температура полученной плазмы выше на 300 К и составляет около 5500 К. Показано, что интенсивности линий аналитов в новом ИВС в 2 – 5 раз больше, чем в МП 2450 МГц, а пределы обнаружения большинства элементов ниже. Изучено матричное влияние Mg, Ca, K, Na на величину аналитического сигнала ряда элементов. Матричное влияние ИВС c МП возрастает в ряду: Mg &lt; Ca &lt; K &lt; Na. При введении в МП 2450 МГц 0,5 % Na плазма гасла. Для МП 915 МГц матричный эффект выражен слабее: для линий с энергией возбуждения &gt;8 эВ при введении 0,5 %-ного раствора K интенсивность линий аналитов снижается в 5 раз, тогда как для МП 2450 МГц — в 10 раз. Относительное СКО составило около 3 % за 3 ч измерений. Несмотря на некоторое улучшение характеристик нового ИВС с частотой возбуждения плазмы 915 МГц, этого явно недостаточно для замены традиционного источника МП 2450 МГц в коммерческих спектрометрах.</p></abstract><trans-abstract xml:lang="en"><p>An experimental prototype of a new spectral excitation source based on microwave induced plasma with an excitation field frequency of 915 MHz and a power of up to 3000 W has been created. The plasma in this source is excited by an H011 wave in a cylindrical microwave resonator with a dielectric element installed inside and has a shape and dimensions close to those of an argon ICP. Compared to a traditional microwave plasma with an excitation frequency of 2450 MHz, the temperature of the resulting plasma is 300 K higher and amounts to approximately 5500 K. It has been shown that the intensities of analyte lines are 2 – 5 times higher compared to traditional MIP sources with a frequency of 2450 MHz, and the detection limits for most elements are lower. The influence of matrix elements on the magnitude of the analytical signal has been studied using Mg, Ca, K, and Na as examples. The matrix influence of the spectral excitation source with MIP (915 MHz) is similar to that of MIP (2450 MHz) and increases in the following order: Mg &lt; Ca &lt; K &lt; Na. When 0.5% Na was introduced into the MIP (2450 MHz), the plasma was quenched. For the MIP (915 MHz), the matrix effect was less pronounced: for lines with energies &gt;8 eV, the introduction of a 0.5% K solution reduced the analyte intensity by a factor of 5, while for the MIP (2450 MHz), it decreased by a factor of 10. The relative standard deviation was approximately 3% over 3 h of measurement. Despite some improvement in the performance of the new spectral excitation source with a plasma excitation frequency of 915 MHz, this is clearly insufficient to replace the traditional MIP source with an excitation frequency of 2450 MHz in commercial spectrometers.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>атомно-эмиссионная спектрометрия</kwd><kwd>микроволновая плазма</kwd><kwd>индуктивно-связанная плазма</kwd><kwd>источник возбуждения спектров</kwd><kwd>пределы обнаружения</kwd><kwd>спектрометр</kwd><kwd>СВЧ-магнетрон</kwd><kwd>температура плазмы</kwd><kwd>2450 МГц</kwd><kwd>915 МГц</kwd></kwd-group><kwd-group xml:lang="en"><kwd>atomic emission spectrometry</kwd><kwd>MIP</kwd><kwd>inductively coupled plasma</kwd><kwd>spectral excitation source</kwd><kwd>detection limits</kwd><kwd>spectrometer</kwd><kwd>microwave magnetron</kwd><kwd>plasma temperature</kwd><kwd>2450 MHz</kwd><kwd>915 MHz</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Jankowski K., Reszke E. 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