zldmЗаводская лаборатория. Диагностика материаловIndustrial laboratory. Diagnostics of materials1028-68612588-0187ООО «Издательство «ТЕСТ-ЗЛ»10.26896/1028-6861-2026-92-4-50-54zldm-2798Research ArticleФИЗИЧЕСКИЕ МЕТОДЫ ИССЛЕДОВАНИЯ И КОНТРОЛЯPHYSICAL METHODS OF RESEARCH AND MONITORINGИсследование структуры и магнитных свойств толстых пленок BaFe12O19, полученных методом шликерного литьяResearch of structure and magnetic properties of thick BaFe12O19 films obtained by slip castingКостишинВ. Г.KostishinV. G.

Владимир Григорьевич Костишин

119049, Москва, Ленинский просп., д. 4, стр. 1

Vladimir G. Kostishin

4, str. 1, Leninsky prosp., Moscow, 119049

drvgkostishyn@mail.ruСысоевМ. А.SysoevM. A.

Максим Алексеевич Сысоев

119049, Москва, Ленинский просп., д. 4, стр. 1

Maksim A. Sysoev

4, str. 1, Leninsky prosp., Moscow, 119049

ИсаевИ. М.IsaevI. M.

Игорь Магомедович Исаев

119049, Москва, Ленинский просп., д. 4, стр. 1

Igor M. Isaev

4, str. 1, Leninsky prosp., Moscow, 119049

ПрусаковА. Д.PrusakovA. D.

Алексей Дмитриевич Прусаков

119049, Москва, Ленинский просп., д. 4, стр. 1

Alexey D. Prusakov

4, str. 1, Leninsky prosp., Moscow, 119049

Национальный исследовательский технологический университет МИСИСРоссияNational Research Technological University MISISRussian Federation2026280420269245054Copyright © Костишин В.Г., Сысоев М.А., Исаев И.М., Прусаков А.Д., 20262026Костишин В.Г., Сысоев М.А., Исаев И.М., Прусаков А.Д.Kostishin V.G., Sysoev M.A., Isaev I.M., Prusakov A.D.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://www.zldm.ru/jour/article/view/2798

Анизотропные толстые пленки гексагонального феррита бария BaFe12O19 применяют при конструировании и производстве микрополосковых устройств СВЧ-электроники, устройств спинволновой электроники и магноники. Цель работы — исследование кристаллической структуры и магнитных свойств пленок BaFe12O19 разной толщины. Пленки получали методом шликерного литья. Исходный материал — ферритизированный порошок гексаферрита бария, синтезированный методом стандартной керамической технологии. В качестве пленкообразователя использовали поливинилбутираль, в качестве растворителей — этиловый спирт, бутилацетат и дибутилфталат. Соотношение порошка BaFe12O19 к пленкообразователю с растворителями составляло 70/30, толщина полученных пленок после спекания — 73, 340 и 770 мкм. Рентгеновский фазовый анализ образцов проводили с помощью автоматизированного рентгеновского дифрактометра ДРОН-4, петли магнитного гистерезиса объектов исследования регистрировали при комнатной температуре. Установлено, что основная фаза пленок — гексаферрит бария (параметры кристаллической решетки: a = 5,88 Å, c = 23,19 Å). Обнаруженная на дифрактограммах примесь, вероятно, относится к пленкообразователю и растворителю. Показано, что коэрцитивная сила синтезированных пленок составляет ~3 кЭ, остаточная удельная намагниченность — 20 – 26 эму/г, а величина степени магнитной текстуры находится в пределах 10,98 – 15,70, что говорит об анизотропии образцов. Полученные результаты могут быть использованы при производстве и совершенствовании устройств магнитоэлектроники, СВЧ-микроэлектроники, а также спинволновой электроники и магноники.

Anisotropic thick films of hexagonal barium ferrite BaFe12O19 are used in the design and manufacture of microstrip microwave electronics devices, spinwave electronics devices and magnonics. The aim of the work is to study the crystal structure and magnetic properties of BaFe12O19 films of different thicknesses. The films were obtained by the method of slip casting. The starting material is ferritized barium hexaferrite powder synthesized using standard ceramic technology. Polyvinyl butyral was used as a film-forming agent, ethyl alcohol, butyl acetate and dibutyl phthalate were used as solvents. The ratio of BaFe12O19 powder to solvent film-forming agent was 70/30, and the thickness of the obtained films after sintering was 73, 340, and 770 μm. X-ray phase analysis of the samples was performed using an automated X-ray diffractometer DRON-4, the magnetic hysteresis loops of the study objects were recorded at room temperature. It is established that the main phase of the films is barium hexaferrite (crystal lattice parameters: a = 5.88 Å, c = 23.19 Å). The impurity found on the diffractograms probably refers to the film-forming agent and solvent. It is shown that the coercive force of the synthesized films is ~3 kOe, the residual specific magnetization is 20 – 26 emu/g, and the degree of magnetic texture is in the range of 10.98 – 15.7, which indicates the anisotropy of the samples. The results obtained can be used in the manufacture and improvement of devices for magnetoelectronics, microwave microelectronics, as well as spinwave electronics and magnonics.

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The authors declare that there are no conflicts of interest present.