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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zldm</journal-id><journal-title-group><journal-title xml:lang="ru">Заводская лаборатория. Диагностика материалов</journal-title><trans-title-group xml:lang="en"><trans-title>Industrial laboratory. Diagnostics of materials</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1028-6861</issn><issn pub-type="epub">2588-0187</issn><publisher><publisher-name>ООО «Издательство «ТЕСТ-ЗЛ»</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zldm-357</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ИССЛЕДОВАНИЕ СТРУКТУРЫ И СВОЙСТВ ФИЗИЧЕСКИЕ МЕТОДЫ ИССЛЕДОВАНИЯ И КОНТРОЛЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>STRUCTURE AND PROPERTIES INVESTIGATION PHYSICAL METHODS OF INVESTIGATION AND MONITORING</subject></subj-group></article-categories><title-group><article-title>ЭЛЕКТРИЧЕСКИЕ СВОЙСТВА ВЫСОКОКАЧЕСТВЕННЫХ СИНТЕТИЧЕСКИХ МОНОКРИСТАЛЛОВ АЛМАЗА, ЛЕГИРОВАННЫХ БОРОМ, И ДИОДОВ ШОТТКИ НА ИХ ОСНОВЕ</article-title><trans-title-group xml:lang="en"><trans-title>Electrical Properties of the High-Quality Synthetic Boron-Doped Single Crystal Diamonds and Schottky Barrier Diodes on Their Base</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Бормашов</surname><given-names>В. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Bormashov</surname><given-names>V. S.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тарелкин</surname><given-names>С. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Tarelkin</surname><given-names>S. A.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Буга</surname><given-names>С. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Buga</surname><given-names>S. G.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Волков</surname><given-names>А. П.</given-names></name><name name-style="western" xml:lang="en"><surname>Volkov</surname><given-names>A. P.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Голованов</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Golovanov</surname><given-names>A. V.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Кузнецов</surname><given-names>М. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Kuznetsov</surname><given-names>M. S.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Корнилов</surname><given-names>Н. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Kornilov</surname><given-names>N. V.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тетерук</surname><given-names>Д. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Teteruk</surname><given-names>D. V.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Терентьев</surname><given-names>С. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Terentiev</surname><given-names>S. A.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Бланк</surname><given-names>В. Д.</given-names></name><name name-style="western" xml:lang="en"><surname>Blank</surname><given-names>V. D.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Технологический институт сверхтвердых и новых углеродных материалов</institution><country>Russian Federation</country></aff><aff xml:lang="ru" id="aff-2"><institution>Технологический институт сверхтвердых и новых углеродных материалов; Московский физико-технический институт</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2017</year></pub-date><pub-date pub-type="epub"><day>10</day><month>01</month><year>2017</year></pub-date><volume>83</volume><issue>1 ч.I</issue><fpage>36</fpage><lpage>42</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Бормашов В.С., Тарелкин С.А., Буга С.Г., Волков А.П., Голованов А.В., Кузнецов М.С., Корнилов Н.В., Тетерук Д.В., Терентьев С.А., Бланк В.Д., 2017</copyright-statement><copyright-year>2017</copyright-year><copyright-holder xml:lang="ru">Бормашов В.С., Тарелкин С.А., Буга С.Г., Волков А.П., Голованов А.В., Кузнецов М.С., Корнилов Н.В., Тетерук Д.В., Терентьев С.А., Бланк В.Д.</copyright-holder><copyright-holder xml:lang="en">Bormashov V.S., Tarelkin S.A., Buga S.G., Volkov A.P., Golovanov A.V., Kuznetsov M.S., Kornilov N.V., Teteruk D.V., Terentiev S.A., Blank V.D.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.zldm.ru/jour/article/view/357">https://www.zldm.ru/jour/article/view/357</self-uri><abstract><p>Исследованы температурные зависимости удельного сопротивления и коэффициента Холла высококачественных легированных бором синтетических монокристаллов алмаза, выращенных методом высокого давления при повышенной температуре. Концентрация акцепторов в вырезанных путем изменения содержания бора в ростовой смеси (0,0004 - 0,04 % ат.) пластинах ориентации (001) изменялась в диапазоне 2 • 1015 - 3 • 1017 см3. Тонкие прямоугольные пластины с однородным содержанием бора и без протяженных дефектов структуры вырезали лазером после рентгеновской топографии и картирования УФ-люминесценции. Концентрации доноров и акцепторов в образцах рассчитывали из данных эффекта Холла и вольт-фарадных характеристик. Полученные результаты коррелируют с содержанием бора в смеси роста. Минимальный коэффициент компенсации акцепторов донорами (ниже 1 %) наблюдался в кристаллах, выращенных с 0,002 % ат. содержанием бора в ростовой смеси. При увеличении или уменьшении количества бора коэффициент повышался. Выращенные при такой концентрации бора образцы имели максимальную подвижность носителей заряда (2200 см2/(В • с) при T = 300 К и 7200 см2/(В • с) при T =180 К). Фононное рассеяние дырок доминировало во всем диапазоне температур (180 - 800 К), а рассеяние точечными дефектами (нейтральными и ионизированными атомами примеси) было незначительным. Кристаллы алмаза, выращенные из смеси, содержащей 0,0005 - 0,002 % ат. бора, и имеющие безупречное качество и решеточный механизм рассеяния, могут рассматриваться как образцовый полупроводник.</p></abstract><trans-abstract xml:lang="en"><p>Temperature dependencies of the resistivity and Hall coefficient in high-quality boron-doped synthetic diamond single crystals grown by HPHT method with different boron content are investigated. Acceptor concentration is varied in the range of 2 X 1015 -3 x 1017 cm3 in (001) cut plates via changing the boron content in the growth mixture in the range of 0.0004 - 0.04 at.%. Thin rectangular plates with uniform boron content and free of extended structural defects are subjected to laser cutting after x-ray topography and UV luminescence mapping. Donor and acceptor densities in each sample are calculated from the data of Hall effect and current-voltage characteristics. The concentrations correlate with the boron content in the growth mixture. The minimum donors to acceptors compensation ratio less than 1% is observed in crystals grown in the growth mixture containing 0.002 at.% boron, while any change in the boron content increases the ratio. Samples grown at aforementioned boron concentration exhibit the maximum charge carrier mobility: 2200 cm2/(V · sec) at T = 300 K and 7200 cm2/(V · sec) at T = 180 K. The phonon scattering of holes dominates over the entire temperature range 180- 800 K, and scattering on the point defects, such as neutral and ionized impurity atoms is negligible. The diamond crystals grown from a mixture containing from 0.0005 to 0.002 at.% boron exhibiting excellent quality and lattice scattering mechanism can be considered reference semiconductor materials.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>полупроводниковый алмаз</kwd><kwd>электрические свойства</kwd><kwd>диод Шоттки</kwd><kwd>semiconductor diamond</kwd><kwd>electrical properties</kwd><kwd>Schottky diode</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Polyakov S. N., Denisov V. N., Kuzmin N. V., Kuznetsov M. S., Martyushov S. Y., Nosukhin S. A., Terentiev S. A., Blank V. D. Characterization of top-quality type Ila synthetic diamonds for new X-ray optics / Diamond Rel. Mater. 2011. Vol. 20. P. 726 - 728.</mixed-citation><mixed-citation xml:lang="en">Polyakov S. N., Denisov V. N., Kuzmin N. V., Kuznetsov M. S., Martyushov S. Y., Nosukhin S. A., Terentiev S. 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