For citations:

Dvoretskov R.M., Karachevtsev F.N., Zagvozdkina T.N., Svetlov I.L. Determination of modifying additives and impurities in Nb – Si-based composites using inductively coupled plasma atomic emission spectrometry (ICP AES). Industrial laboratory. Diagnostics of materials. 2020;86(1):19-25. (In Russ.) https://doi.org/10.26896/1028-6861-2020-86-1-19-25