Preview

Industrial laboratory. Diagnostics of materials

Advanced search

Determination of refractive indices of materials in modeling multilayer mirrors

https://doi.org/10.26896/1028-6861-2023-89-5-36-40

Abstract

Thin-film coatings for optical elements are widely used in various industries. Antireflection coatings are used in display screens, photodetectors, fiber optic light guides, mirror coatings are used for telescopes, medical equipment, etc. One of the main goals in the production of thin-film coatings is to determine the refractive index and the choice of materials applied to optical products. We present the results of determining the refractive indices of materials used for the manufacture of multilayer mirrors with the desired spectral characteristics. In general, light reflection occurs at the interface between two materials, for example, glass and air. Dielectric films were obtained by high-frequency ion-beam sputtering of the target. It is shown that the refractive index of the SiO2 film must be repeatedly corrected to minimize systematic errors. The results obtained can be used in the production of high-precision optical systems for various industries, especially medicine, space instrumentation, aviation and others.

About the Authors

A. A. Sergienko
National Research Technological University «MISIS»
Russian Federation

Andrey A. Sergienko

4, Leninsky prosp., Moscow, 119049



D. B. Pushkin
National Research Technological University «MISIS»
Russian Federation

Dmitriy B. Pushkin

4, Leninsky prosp., Moscow, 119049



P. A. Konotopov
JSC Scientific Research Institute NPO «LUCH»
Russian Federation

Pavel A. Konotopov

24, Zheleznodorozhnaya ul., Podolsk, Moscow obl., 142103



A. D. Cheremnykh
National Research Technological University «MISIS»
Russian Federation

Alexey D. Cheremnykh

4, Leninsky prosp., Moscow, 119049



References

1. Macleod H. A. Optical Thin Films and Coatings. — Taylor and Francis Group, 2010.

2. Tikhonravov A., Trubetskov M., Amotchkina T. Optical Thin Films and Coatings. — Cambridge: Woodhead, 2018.

3. Semenov Z. V. Indirect method research optical thickness control of multilayer coatings in a wide spectral range / Interexpo Geo-Siberia. 2018. Vol. 5. N 2. P. 179 – 191.

4. Tikhonravov A., Trubetskov M., Kokarev M., et al. Influence of systematic errors in spectral photometric measurements on the determination of optical thin film parameters / Optical Interference Coatings, Optical Society of America. 2001. Paper TuD2. DOI: 10.1364/OIC.2001.TuD2

5. Burdovitsin V., Bakeev I. Karpov K., Ngon Kiki L., Oks E., Vizir A. Characteristics of a source for oxide coating deposition by the electron-beam evaporation of dielectric materials / Plasma. 2022. Vol. 5. N 2. P. 258 – 264. DOI: 10.3390/plasma5020020

6. Amotchkina T. V., Tikhonravov A. V., Trubetskov M. K., Yanshin S. A. Structural properties of antireflection coatings / Optical Interference Coatings. Optical Society of America. 2007. Paper WB 5. DOI: 10.1364/OIC.2007.WB5

7. Macleod H. A. Turning value monitoring of narrow-band all-dielectric thin-film optical filters / Optica Acta: International Journal of Optics. 1972. N 1. P. 1 – 28.

8. Macleod H. A. Thin Film Optical Filters. — CRC Press, 2001.

9. Tikhonravov A., Trubetskov M., Kozlov I., et al. Correlated Choice of Design and Monitoring Strategy / Optical Interference Coatings. Optical Society of America. 2013. Paper WB3. DOI: 10.1364/OIC.2013.WB3

10. Kochikov I. V., Sharapova S. A., Yagola A. G., Tikhonravov A. V. Correlation of errors in inverse problems of optical coatings monitoring / J. Inverse Ill-Posed Probl. 2020. N 6. P. 915 – 921. DOI: 10.1515/jiip-2020-0079

11. Baumeister P. W. Methods of altering the characteristics of a multilayer stack / Journal of the Optical Society of America. 1962. N 10. P. 1149 – 1152.

12. Thoeni W. P. Deposition of optical coatings: process control and automation / Thin Solid Films. 1982. N 4. P. 385 – 397.

13. Zorc H. Optimum multilayer design selection in relation to production errors / Vacuum. 1987. N 1 – 2. P. 101 – 102.

14. Isaev T. F., Tikhonravov A. V., Yagola L. G. On the Choice of a Strategy for Broadband Optical Monitoring of the Deposition of Multilayer Coatings / Moscow University Physics Bulletin. 2021. Vol. 76. P. 36 – 41. DOI: 10.3103/S0027134921010070

15. Zoeller A., Williams J., Hartlaub S. Precision filter manufacture using direct optical monitoring / Proceedings of the OIC 11th Topical Meeting. — Washington DC: OSA, 2010. P. 6 – 11. DOI: 10.1364/OIC.2010.TuC8

16. Tikhonravov A. V., Kochikov I. V., Matvienko I. A., et al. Correlation of errors in optical coating production with broad band monitoring / Num. Methods Program. 2018. Vol. 19. P. 439 – 448. DOI: 10.26089/NumMet.v19r439

17. Stenzel O., Wilbrandt S., Kaiser N., Fasold D. Development of a hybrid monitoring strategy to the deposition of chirped mirrors by plasma-ion assisted electron evaporation / Proc. SPIE. 2008. N 7101. DOI: 10.1117/12.799711

18. Semenov Z., Labuzov A., Zarubin A., Erg G. Application of multilayer dielectric coatings for suppression of radiation of non-working orders of the spectrum in spectrometers with a diffraction grating / Zavod. Lab. Diagn. Mater. 2017. Vol. 83. N 1. Part II. P. 86 – 89 [in Russian].


Review

For citations:


Sergienko A.A., Pushkin D.B., Konotopov P.A., Cheremnykh A.D. Determination of refractive indices of materials in modeling multilayer mirrors. Industrial laboratory. Diagnostics of materials. 2023;89(5):36-40. (In Russ.) https://doi.org/10.26896/1028-6861-2023-89-5-36-40

Views: 308


ISSN 1028-6861 (Print)
ISSN 2588-0187 (Online)