Study of temperature and frequency dependences of quartz glass in the microwave range
https://doi.org/10.26896/1028-6861-2023-89-5-41-45
Abstract
The use of glass in microwave devices requires study of the dielectric properties of the material. We present the results of studying temperature and frequency dependences of the dielectric properties of quartz glass in the microwave region. The frequency dependence of the dielectric permittivity and dielectric loss tangent were determined using high-precision devices based on resonant cavity at a fixed frequency within a range of 8 – 26 GHz under a normal temperature. The temperature dependence was obtained using resonant cavity made of platinum coated quartz glass with a low thermal-expansion coefficient and insignificant change of intrinsic parameters under heating up to 1200°C. Experimental temperature and frequency dependences of the dielectric permittivity and dielectric loss tangent were obtained using classical conduction mechanisms taking into account the structural peculiarities of quartz glass. The effect of ionic conductivity was also evaluated in quartz glass in the microwave region. The revealed changes in the temperature dependence of the permittivity do not exceed the measurement error. The results obtained can be used for practical application of quartz glass in radio-engineering devices.
About the Author
V. P. Krylov
A. G. Romashin ONPP «Technology»,
Russian Federation
Russian Federation
Vitalii P. Krylov
15, Kievskoe sh., Obninsk, Kaluga obl., 249031
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Review
For citations:
Krylov V.P. Study of temperature and frequency dependences of quartz glass in the microwave range. Industrial laboratory. Diagnostics of materials. 2023;89(5):41-45. (In Russ.) https://doi.org/10.26896/1028-6861-2023-89-5-41-45
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