For citations:
Medvedev N.S., Put’Makov A.N., Shaverina A.V., Tsygankova A.R., Saprykin A.I. Reduction of the Detection Limits in Trace Analysis of High Purity Substances by ICP-AES. Industrial laboratory. Diagnostics of materials. 2015;81(1):157-160. (In Russ.)
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