Vasil’Ev A.L., Mityukhlyaev V.B., Mikhutkin A.A., Todua P.A., Filippov M.N. Evaluation of the Component of the Systematic Error in X-Ray Microanalysis Attributed to the Surface Relief of the Sample. Industrial laboratory. Diagnostics of materials. 2016;82(12):15-18. (In Russ.)
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Baikov Institute of Metallurgy and Materials Science, RAS
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