For citations:
Khomichenko N.N., Shaverina A.V., Tsygankova A.R., Saprykin A.I. Development of ICP-AES Analysis of Silicon, Germanium and Their Oxides. Industrial laboratory. Diagnostics of materials. 2015;81(6):10-15. (In Russ.)
Khomichenko N.N., Shaverina A.V., Tsygankova A.R., Saprykin A.I. Development of ICP-AES Analysis of Silicon, Germanium and Their Oxides. Industrial laboratory. Diagnostics of materials. 2015;81(6):10-15. (In Russ.)