THE USE OF THE PROFILE ANALYSIS OF DIFFRACTION PEAKS FOR DETERMINATION OF THE PHASE RELATIONSHIPS IN THE SYSTEM (1 -2x)BiScO3 xPbTiO3 • xPbMg1/3Nb2/3O3 NEAR THE MORPHOTROPIC BOUNDAR
https://doi.org/10.26896/1028-6861-2019-85-4-22-27
Abstract
To determine the phase relationships in the system (1 - 2x)BiSc03 • xPbTi03 • xPbMg1/3Nb2/303 near the morphotropic boundary, the ceramic samples for x = 0.34 and x = 0.46 were studied by the XRD method. The profiles of nine regions of the XRD patterns were analyzed using WinFit software. In both cases, a much better agreement with the experimental data was observed with the introduction of additional phases with cubic symmetry. The simulation of the full x-ray diffraction patterns of the samples using the Le Bail method was also carried out. The studied samples contain two phases: the main with a cubic (o = 4.0432 A) (x = 0.34) and tetragonal (o = 3,9963 А, с = 4.0580 A) (x = 0.46) unit cells and additional one. The additional phases with broad diffraction peaks can be considered cubic (with the unit cell parameters a - 4.045 A and a - 4.017 A, respectively).
About the Authors
Vladimir R. Sirotinkin
Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences, Moscow
Россия
Россия
Alexandr A. Bush
Moscow Technological University (MIREA), Moscow, 119454
Россия
Россия
Alexandr I. Spitsin
Moscow Technological University (MIREA), Moscow, 119454
Россия
Россия
Andrei G. Segalla
ELPA Research Institute, Zelenograd, Moscow
Россия
Россия
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Review
For citations:
Sirotinkin V.R., Bush A.A., Spitsin A.I., Segalla A.G. THE USE OF THE PROFILE ANALYSIS OF DIFFRACTION PEAKS FOR DETERMINATION OF THE PHASE RELATIONSHIPS IN THE SYSTEM (1 -2x)BiScO3 xPbTiO3 • xPbMg1/3Nb2/3O3 NEAR THE MORPHOTROPIC BOUNDAR. Industrial laboratory. Diagnostics of materials. 2019;85(4):22-27. (In Russ.) https://doi.org/10.26896/1028-6861-2019-85-4-22-27
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