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DETERMINATION OF NICKEL, ZINC AND COBALT IN ADVANCED MATERIALS BASED ON NixCo3–xO4 AND ZnxCo3–xO4 BY INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (ICP-MS) AND X-RAY FLUORESCENCE

https://doi.org/10.26896/1028-6861-2018-84-1-I-10-13

Abstract

An approach to analysis of advanced sensor materials based on cobalt oxide modified with zinc or nickel oxides is developed using X- ray fluorescence analysis (XRF) and inductively coupled plasma mass spectrometry (ICP-MS). It is shown that determination of Ni, Zn and  Co in novel materials based on cobalt oxide using ICP-MS in  solutions is possible, standard deviation being 0.06, 0.06, and 0.05,  respectively. The results of the ICP-MS determination of the  elements in solutions are used to certify the results obtained by XRF  method without sample preparation. It is shown that NixCo3–xO4–д  samples can be correctly analyzed without decomposition using X- ray fluorescence analysis. The results of the determination match  theoretically calculated values both for the samples obtained from  nitrates and from nickel and cobalt oxalates as well. However,  calibration based on the ICP-MS results is necessary for X-ray fluorescence analysis of ZnxCo3–xO4 samples. It is shown that zinc content in the samples exceeds the theoretical determined value by  10 – 30% due to incomplete precipitation of cobalt from the solution upon synthesis.

About the Authors

A. A. Krotova
M. V. Lomonosov Moscow State University
Russian Federation
Faculty of Chemistry


K. Ya. Prikhodko
M. V. Lomonosov Moscow State University
Russian Federation
Faculty of Chemistry


S. A. Vladimirova
M. V. Lomonosov Moscow State University
Russian Federation
Faculty of Chemistry


D. G. Filatova
M. V. Lomonosov Moscow State University
Russian Federation
Faculty of Chemistry


References

1. Rumyantseva M. N., Makeeva E. A., Gas’kov A. M. Influence of the microstructure of semiconductor sensor materials on oxygen chemisorption on their surface / Russ. J. Chem. (Russian Federation). 2008. Vol. 78. No. 12. P. 2556 – 2565.

2. Kolbe M., Beckhoff B., Krumrey M., Ulm G. Thickness determination for Cu and Ni nanolayers: comparison of completely reference-free fundamental parameter-based x- ray fluorescence analysis and x-ray reflectometry / Spectrochim. Acta. Part B. 2005. Vol. 60. P. 505 – 510.

3. Beckhoff B., Fliegauf R., Kolbe M., et al. Reference-free total reflection x-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation / Anal. Chem. 2007. Vol. 79. P. 7873 – 7882.

4. Kelner R., Merme J.-M., Otto M., Vidmer G. M. Analytical chemistry. Problems and approaches. Vol. 2. — Moscow.: Mir, 2004. P. 88 [Russian translation].

5. Kocot K., Zawisza B., Sitko R. Dispersive liquid-liquid microextraction using diethyldithiocarbamate as a chelating agent and the dried-spot technique for the determination of Fe, Co, Ni, Cu, Zn, Se and Pb by energy-dispersive x-ray fluorescence spectrometry / Spectrochim. Acta. Part B. 2012. Vol. 73. P.79–83.

6. Leonardo Sena Gomes Teixeira, Elenir Souza Santos, Luana Sena Nunesa. Determination of copper, iron, nickel and zinc in ethanol fuel by energy dispersive x-ray fluorescence after pre-concentration on chromatography paper / Anal. Chim. Acta. 2012. Vol. 722. P.29–33.

7. Zawisza B., Sitko R., Malicka E., Talik E. Graphene oxide as a solid sorbent for the preconcentration of cobalt, nickel, copper, zinc and lead prior to determination by energy-dispersive x-ray fluorescence spectrometry / Anal. Methods. 2013. Vol. 5. P. 6425 – 6430. DOI: 10.1039/C3AY41451E.

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Review

For citations:


Krotova A.A., Prikhodko K.Ya., Vladimirova S.A., Filatova D.G. DETERMINATION OF NICKEL, ZINC AND COBALT IN ADVANCED MATERIALS BASED ON NixCo3–xO4 AND ZnxCo3–xO4 BY INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (ICP-MS) AND X-RAY FLUORESCENCE. Industrial laboratory. Diagnostics of materials. 2018;84(1(I)):10-13. (In Russ.) https://doi.org/10.26896/1028-6861-2018-84-1-I-10-13

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ISSN 1028-6861 (Print)
ISSN 2588-0187 (Online)