Evaluation of the effect of the surface preparation quality of tungsten alloy samples on residual stresses determined by x-ray diffraction

The use of modern high-speed sintering methods in the production of tungsten alloys leads to the appearance of residual stresses in the material. The objective of this work was to conduct an X-ray diffraction study of internal stresses in tungsten alloy samples with various microstructural parameters. The study focused on the role of sample surface quality and the influence of sample preparation on the results. It has been established that the reliability of X-ray diffraction data for highly absorbing tungsten alloy samples depends significantly on surface quality. Differences in diffraction patterns were assessed using the Bragg – Brentano scheme and symmetrical shooting with a parallel primary beam. It has been shown that the reproducibility of the unit cell parameter determination procedure allows for combining both optical schemes within a single study. It has been found that mechanical polishing of the tungsten alloy sample surface to a roughness of 1 μm does not provide comparable quality for X-ray diffraction studies as electrochemical polishing. The value of the residual stress component normal to the sample surface does not depend significantly on the quality of sample preparation. The results obtained can be used to improve manufacturing technologies for tungsten alloys-based products with predictable physical and mechanical properties.

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