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Industrial laboratory. Diagnostics of materials

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For citations:

Darznek S.A., Mityukhlyaev V.B., Todua P.A., Filippov M.N. Electron Probe X-Ray Analysis of Nano-Films at Off-Normal Incidence of the Electron Beam. Industrial laboratory. Diagnostics of materials. 2017;83(9):5-9. (In Russ.)



ISSN 1028-6861 (Print)
ISSN 2588-0187 (Online)

LENINSKY PR. 49, OFFICE 513, MOSCOW, 119334 RUSSIA
Baikov Institute of Metallurgy and Materials Science, RAS
Ph: 8 499 135 62 75, 8 499 135 96 56, 8 903 731 31 07
Е-mail: zavlabor@imet.ac.ru
E-mail: zav1932lab@mail.ru 

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