For citations:
Imamov R.M., Klechkovskaya V.V., Galiev G.B., Pushkarev S.S., Ganin G.V., Maltsev P.P. Diagnostics of Multilayer Nanomaterials Using Methods of X-Ray and Electron Crystallography. Industrial laboratory. Diagnostics of materials. 2016;82(9):31-42. (In Russ.)